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Warren McKenzie |
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Position |
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Research Associate |
Contact |
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Email: warren.mckenzie@unsw.edu.au
Ph: + 61 2 9385 6468
Fax: + 61 2 9385 6400 |
Qualifications |
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B.E. (Hons) Materials Science, 2002 (UNSW), M.Com. Finance, 2005 (UNSW), PhD (Materials Science) 2006 (UNSW) |
Role |
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Managing research and training on the JEOL JXA-8500F Hyperprobe (EPMA); additional support for various instruments including the Philips CM200 Field Emission TEM, FEI Nova 200 Dual Beam FIB, and FEI xP200 FIB. |
Background |
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2007-2009 Postdoctoral Research Associate - Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN) Trinity College Dublin, Ireland. |
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2005 – 2007 Technical Officer – Electron Microscope Unit – University of New South Wales |
Research Interests:
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Nano-scale fabrication of diamond, characterisation of ion implanted diamond, Ion-solid interactions, thin film and interface fabrication and characterization, silicon on sapphire, semiconductor crystallography, novel atom probe and TEM sample preparation techniques. The commercial development of research. |
Publications include:
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C.J. Cheng, D. Kan, S.H. Lim, W.R. McKenzie et al., “Structural transitions and complex domain structures across a ferroelectric-to-antiferroelectric phase boundary in epitaxial Sm-doped BiFeO3 thin films” Phys. Rev. B 80, 014109 (2009). |
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W.R. McKenzie, J.B. Pethica and G.L.W. Cross, “FIB Hard Mask Diamond patterning – Dies for Nanoimprint and Nanoimprint Lithography”, Diamond (2009). |
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W.R. McKenzie, J.B. Pethica and G.L.W. Cross, “Process and System for Fabrication of Patterns on a Surface”, European Patent EPO140722.7 (2008). |
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J.M. Cairney, W. McKenzie, D.W. Saxey, P.R. Munroe, and S.P. Ringer, “Recent advances in FIB-based site-specific atom probe specimen preparation Techniques”, Microsc Microanal 13(Suppl 2), (2007). |
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W.R. McKenzie, H. Domyo, T. Ho, P.R, Munroe, “The evolution of low defect density structures in silicon-on-sapphire thin films during post-ion implantation heat treatments”, Microscopy of Semiconducting Materials (2005). |
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W.R. McKenzie, P. R. Munroe, F. Budde, B. J. Ruck, S. Granville, H.J. Trodahl, “TEM Characterisation of GdN Thin Films”, Current Applied Physics, Volume 6, Issue 3, Pages 407-410 June (2006). |
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