Hitachi S900    Hitachi S4500    FEI Quanta 200 ESEM    Hitachi S3400

Hitachi S900:

The Hitachi S-900 is an 'in-lens' field emission scanning electron microscope capable of imaging at very high resolutions (~0.5nm). The field emission gun provides a fine, but intense beam of electrons which can be used to obtain a meaningful signal of very fine detail on the specimen surface. The 'in-lens' capability of this instrument means that the specimens sit inside the objective lens of the instrument. This maximises resolution by reducing the focal length and aberrations of the lens, but also limits the specimen size to a ~5 x 10 x 2.5mm. This instrument is used, for example, to image fine pores in ultrafiltration membranes and in the analysis of solar cells.

Click here: Operating Instructions for the Hitachi S900

For further information about the use of the S900 please contact Sigrid Fraser or Cristin Quinnell

Hitachi S4500:

The Hitachi 4500II is a "below lens", field emission scanning electron microscope. It is used for microstructural analysis of a very wide range of materials and is capable of very high resolution (~2nm) images. The field emission gun means that electrons are extracted not by thermionic emission, but by the force of an intense electric field around the tip of the filament. This produces a very fine, but highly intense beam. The 4500 has a large specimen chamber capable of accommodating specimens up to six inches in diameter. This instrument has two secondary electron detectors, (upper and lower) which provide topographic images from two perspectives. A Robinson backscattered electron detector can be used to obtain compositional contrast. In addition, an Oxford Isis energy dispersive x-ray analyser is interfaced to the column which allows qualitative and quantitative microchemical analysis to be performed. This detector has a thin window capable of detecting elements as low as boron in the periodic table. Furthermore, a Oxford MonoCL cathodoluminescence detector is fitted to this instrument. This is used to detect photons which are emitted from some materials (most usually ceramics and semiconductors). The wavelength of this radiation is dependent on a number of material parameters, for example composition, and the dispersive nature of the CL detector can be used to measure wavelength and allow analysis to be performed.

Click here: Operating Instructions for the Hitachi S4500

For further information about the use of the S4500 please contact Eugene White or Cristin Quinnell.

FEI Quanta 200 ESEM:

The FEI Quanta 200 is a particularly versatile microscope capable of operating in three different vacuum modes. It may be used in a high vacuum or conventional mode to examine dry conductive specimens. Alternatively, it may be used in a low vacuum (0.1-1.0 Torr) mode to examine dry specimens that are not inherently conductive and will not tolerate normal coating procedures. Finally, it may be used in a “wet” or Environmental (1.0 – 20 Torr) mode whereby humidity is maintained around the specimen enabling examination of hydrated specimens. There are some limitations imposed when the microscope is operated in “wet mode” and therefore a research proposal should be submitted for approval prior to undertaking “wet mode” scanning electron microscopy.

For further information about the use of the Quanta please contact Jenny Norman or Marion Stevens-Kalceff.

Hitachi S3400:

The UNSW EMU has two Hitachi S3400 SEMs – the S3400-I (for imaging only) and the S3400-X (for imaging and X-ray microanalysis). These instruments are fitted with secondary and backscatter electron detectors that allow for topographic and compositional (atomic number contrast) surface imaging of samples. These microscopes are routinely used for imaging from ~20x to ~20,000x magnification. The S3400 SEMs are predominantly used in high-vacuum mode, but also have a variable-pressure or “natural” mode that can be useful when imaging vacuum-sensitive specimens or specimens with conductivity problems.

 The S3400-X is fitted with a Thermo Fisher Scientific energy-dispersive X-ray microanalysis system utilising NORAN System SIX software. Users can undertake qualitative and semi-quantitative elemental characterisation of their sample surface using whole-screen scans, points, linescans and maps.

Click here: Operating Instructions for the Hitachi S3400N and User notes for EDS and BSE

For further information about the use of the S3400 please contact Jenny Norman or Eugene White or Cristin Quinnell.