JEOL JXA-8500F Field-Emission SEM-EPMA Hyperprobe (WDS & SDD-EDS)

The JEOL JXA-8500F is a powerful tool in the microanalysis of materials. The electron probe microanalyser (EPMA) is a fully automated instrument employing four wavelength dispersive spectrometers (WDS) and one silicon drift detector energy dispersive x-ray (SDD-EDS) analyser for the detection and nondestructive analysis of most elements (Z≥4) in the periodic table.
Two sample holders are available that accommodate 26mm (1") diameter resin-mounted specimens or petrographic thin sections. Quantitative analysis may be carried out on the bulk matrix and micro-constituents, such as inclusions and grain boundaries in metals, geological materials, coal, ceramic glasses and plastics. X-ray elemental line scans may be carried out across constituents of interest. Users can generate colour-gradient quantitative WDS elemental maps and capture SE and BSE images of the sample area of interest. The instrument is also equipped with a liquid nitrogen trap to reduce contamination during light element analysis. Data generated on the Hyperprobe can be stored directly on the EMU's server and accessed from any computer with internet access. The instrument is run on a Sun System platform via a user-friendly Windows interface. The electron microprobe can be used to perform a wide variety of quantitative elemental investigations, such as the measurement of chemical segregation across diffusion couples, the determination of geological sample composition and the elemental mapping of coal samples. This instrument was funded through the NCRIS program and is available as a national facility to researchers.

Pre-Analysis Preparation Notes

For further information about the use of the JXA-8500F please contact Paul Munroe or Karen Privat.