Digital Instruments 3000 AFM    Digital Instruments Multimode

Digital Instruments 3000 AFM:

The atomic force microscope (AFM) probes the surface of the sample with a sharp tip that is a couple of microns long and around 10 – 60nm in diameter. The tip is located at the free end of a cantilever that is 100 – 200um long. Forces between the tip and the surface cause the cantilever to bend, or deflect. The measured cantilever deflections allow a computer to generate a map of surface topography. Unlike electron microscopes, AFMs do not operate under vacuum and the specimens do not need to be electrically conductive. In most cases only minimal specimen preparation is required. AFMs can be used to examine a wide range of specimens from hard and dry to soft and wet.

Click here: Operating Instructions for the DI 3000

For further information about the use of the DI 3000 please contact Katie Levick, Yun Lin, Sean Lim or Marion Stevens-Kalceff.

Digital Instruments Multimode:

The Multimode atomic force microscope (MM-AFM) is designed for imaging small samples (15mm diameter or less). It is able to achieve higher resolution images than the Dimension AFM.

Click here: Operating Instructions for the Multimode

For further information about the use of the Multimode please contact Katie Levick, Sean Lim or Marion Stevens-Kalceff.